USEPA Seminar - RTP, Durham

Analysis of Nanoparticles in the Environmental Sciences and Life Sciences

Date: 04/22/2010 | 1:00 pm - 3:00 pm
Location: USEPA, RTF building, Room 1405, 2525 E. NC highway 54, Durham, NC

Analysis of Nanoparticles in the Environmental Sciences and Life Sciences

April 22, 2010 1-4PM, USEPA , RTF building (formerly NHEERL) 2525 E. NC highway 54. Room 1405.
Please contact DR Zucker (, 541-1585) with questions. Refreshments will be served. Sponsored by FEI company.

Abstract:  A number of nanoparticle properties are being studied to determine their effects on toxicity, fate, and transport.  Toxicology
studies require the ability to segment cellular structures and simultaneously localize particles within a biological medium.  Electron
microscopy (EM) offers solutions that are not provided by other techniques.  Over the last several years, EM has been increasingly
applied to visualizing nano-scale features in biological samples. Transmission Electron Microscopy (TEM) continues to be a workhorse EM
instrument for life-science applications requiring ultra-high resolution two- and three-dimensional imaging of biological samples.  However,
Scanning Electron Microscopes (SEM) and Dual-Beam (DB) microscopes that combine a SEM with a Focused ion Beam (FIB) are now capable of
extracting high-resolution three-dimensional structural and chemical information from both the surface and the bulk of thick organic
samples.  All three of these instruments are enabling researchers to visualize the distribution of micro- and nano-scale particles within
tissue, and to study their interactions and investigate the toxicology at sub-cellular length-scales.

These presentations will discuss both unique and complimentary EM techniques related to environmental toxicology assessment.

Presentation 1: Dr. Jens Greiser, "Quantitative Particle Characterization ? Solutions To Detection Challenges and Trends in
Micro- and Nano-scale Imaging"

Presentation 2: Dr. Annette Kolodzie, "Determination of Particle Speciation and other Characterization Data for Environmental
Applications Using Automated Mineralogy Technology"

Presentation 3: Mr. Richard Gursky, "Transmission Electron Microscopy as a Tool for Understanding Nano- and Micro-scale particles in

Presentation 4:
Dr. Jens Greiser (for Dr. Ben Lich) "Site-specific Serial Sectioning using Dual-Beam Focused Ion Beam Microscope to
Visualize Tissue and Cell Structures in Three-Dimensions with Nanometer-scale Accuracy"

About the Presenters:
Dr. Jens Greiser manages Strategic and Product Marketing of FEI Company, focusing on Life Sciences. His responsibilities cover the analysis of
emerging business opportunities in nano-driven markets, as well as shaping long-term roadmaps. Dr. Greiser has more than 15 years
experience in the nanotechnology instrument equipment market in a variety of roles. Dr. Greiser graduated in Solid State Physics and
received his Ph.D. in Materials Science in 1999 from the University of Stuttgart, Department of Chemistry.

Mr. Richard Gursky has worked with Electron Microscopy since 1979. Mr. Gursky received his BA in Biology from Kean University in New Jersey.
He has applied EM and other tools in Research and Development while working as lab manager in industry at Celanese Research, Mobile Research
and Unilever Research.  Most recently Richard worked in fundamental Biological research of macro-molecular machines with the Howard Hughes
Medical Institute, where he was involved in the development of automation SW for morphological data acquisition for both single
particles and for Electron Tomography.

Dr. Annette Kolodzie is Strategic Programs Director for FEI Company. Dr. Kolodzie cultivates and manages collaborations between FEI and key
researchers in the United States.  The objective of these partnerships is to develop the next generation electron microscopy and related
instruments and techniques that enable scientists across a wide spectrum of disciplines to engage in the most advanced research in their fields,
including research related to nanoparticle EHS applications and implications. Her technical expertise includes high resolution electron
microscopy and electron energy loss analysis techniques.  Dr. Kolodzie holds Ph.D., J.D., B.S. and B.A. degrees and was a practicing attorney
for a number of years before joining FEI.

For additional details please contact Dr Robert Zucker ( or Robert Alvis FEI Company Account Manager,
Southeastern USA